Development of a Silicon-Based Ultra-Fast X-Ray Beam Size Monitor for SuperKEKB

Matthew Andrew; Riku Nomaru; Gaku Mitsuka; Keisuke Yoshihara; Cody Driver; Christopher J. Kenny; Bela Urbschat; Gary Varner; John W. Flanagan

arXiv · 2607.08205

Development of a Silicon-Based Ultra-Fast X-Ray Beam Size Monitor for SuperKEKB

Matthew Andrew·Riku Nomaru·Gaku Mitsuka·Keisuke Yoshihara·Cody Driver·Christopher J. Kenny·Bela Urbschat·Gary Varner·John W. Flanagan

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Abstract

We present the development of a silicon-based ultra-fast X-ray beam size monitor (SiXRM) for SuperKEKB. The system enables, for the first time at SuperKEKB, bunch-by-bunch measurements of the vertical beam size using synchrotron radiation. The detector combines a silicon strip sensor board, amplifier boards, and fast waveform readout electronics. Beam measurements demonstrate clear reconstruction of the bunch structure and X-ray images for individual bunches. The measured beam sizes show good agreement with those obtained from the existing CMOS-based XRM system. The measurement precision is estimated to be better than 6.4 $\mu$m. This system provides a powerful tool for studying beam dynamics and optimizing luminosity in high-luminosity colliders.

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Matthew Andrew, Riku Nomaru, Gaku Mitsuka, Keisuke Yoshihara, Cody Driver, Christopher J. Kenny, Bela Urbschat, Gary Varner, John W. Flanagan. 2026-07-09. Development of a Silicon-Based Ultra-Fast X-Ray Beam Size Monitor for SuperKEKB. https://arxiv.org/abs/2607.08205

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