arXiv · 2606.20443
Topological Data Analysis for High-Dimensional Dynamic Process Monitoring
Abstract
Real-time process monitoring requires methods that extract actionable information from high-dimensional time-series data. In this work, we present a new approach for process monitoring that combines tools of topological data analysis (TDA) and machine learning. In the proposed approach, we represent multivariate time-series data as manifolds and use topological descriptors to summarize the structure of such data; we then use a neural ordinary differential equation to learn the dynamic evolution of the topological structure of the system. Using real data from an industrial process, we show that this trajectory-based event detection approach is effective at detecting diverse types of events. We contrast this approach against reconstruction-based approaches such as principal component analysis and autoencoders and against a trajectory-based approach that uses Koopman autoencoders.
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Angan Mukherjee, Tyler A. Soderstrom, Michael J. Kurtz, Victor M. Zavala. 2026-06-18. Topological Data Analysis for High-Dimensional Dynamic Process Monitoring. https://arxiv.org/abs/2606.20443
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