Time-of-flight photon spectroscopy for scanning tunneling microscopy luminescence

Abstract

We build and commission a time-of-flight photon spectrometer (TOFS) for scanning tunneling microscopy luminescence (STML). We obtain the spectrum by exploiting the wavelength dependent refractive index of a long dispersive optical fiber that converts photon arrival times into wavelength information; blue photons are delayed more than red photons. The setup uses a pulsed excitation source, either laser flashes or voltage pulses, to launch the photons from the junction into a single photon detector. The TOFS calibration can be performed and transferred to the STML setup from a separate benchtop experiment using pulsed light sources with known wavelength. We verify the TOFS during STML operation by simultaneously recording luminescence from the Ag-Ag(111) plasmon using a conventional grating spectrometer. Our experiments show that the TOFS is a straightforward and cost-effective addition to existing STML setups with good performance in the near-infrared range. The TOFS is compatible with a drop-in replacement of the single photon detector such as a superconducting nanowire single photon detector or even bolometers that may expand the useful spectral range beyond the abilities of current STML setups.