Crystallographic Challenges in Microscopy of Multidomain Spinel Materials

Abstract

Electron microscopy techniques are instrumental in the characterization of energy storage materials, with atomic resolution images providing the detailed structural features that are needed to understand their properties. Atomically resolved electron microscopy techniques have been routinely used to study the microstructure in high performing Mn-based oxide cathodes, which often contain spinel-like ordering. Here, we evaluate STEM-HAADF imaging and subsequent Fourier filtering as tools for characterizing {\delta}-DRX spinel domains and their antiphase boundaries, which play a central role in the material's electrochemical performance. Using electron microscopy simulations and recent theoretical insight into the structural makeup of {\delta}-DRX, we attempt to characterize the crystallographic spinel variants which occur in its multi-domain structure. We show that each domain interface, arising from pairings among eight distinct variants, can be categorized into one of four Fourier filtered profiles, one of which leaves the boundary undetectable in atomically resolved electron microscopy when viewed along the preferred [110] zone axis. Our results also suggest that the appearance of seemingly disordered or layered-like regions might actually arise from low energy domain boundaries which are slanted relative to the [110] viewing direction. Our findings highlight the need for careful interpretation of atomic-resolution micrographs of phase transitions, where local reordering drives transformations from higher to lower symmetry structures while maintaining lattice coherence.