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arXiv · 2602.07792

Systematic Analysis of Ferroelectric Domain Dynamics in Periodically Poled Lithium Niobate Waveguides Using Two-Photon Microscopy and Digital Imaging Processing

Jiuyi Zhang·Christopher Cullen·Matthew Konkol·Peng Yao·Timothy Creazzo·Janusz Murakowski·Ruidong Xue·Xiaofeng Zhu·Md Omar Faruk Rasel·Yash Kabra·Dennis Prather
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Abstract

We present a characterization and analysis methodology suitable for volume production for characterizing and optimizing x-cut thin-film periodically poled lithium niobate (PPLN) devices using two-photon (2P) microscopy with quantitative image processing. This method enables direct extraction of key structural parameters, such as duty cycle, phase-matching behavior, and domain uniformity, across large device sets in a non-destructive manner. By correlating 2P microscopy-derived structural metrics with systematic variations in poling conditions, we establish a scalable, image-driven approach for evaluating and improving PPLN fabrication. The resulting workflow supports wafer-level process development and accelerates the manufacturing and packaging of lithium niobate photonic integrated circuits (PICs).

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Jiuyi Zhang, Christopher Cullen, Matthew Konkol, Peng Yao, Timothy Creazzo, Janusz Murakowski, Ruidong Xue, Xiaofeng Zhu, Md Omar Faruk Rasel, Yash Kabra, Dennis Prather. 2026-02-08. Systematic Analysis of Ferroelectric Domain Dynamics in Periodically Poled Lithium Niobate Waveguides Using Two-Photon Microscopy and Digital Imaging Processing. https://arxiv.org/abs/2602.07792

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