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arXiv · 2602.00958

Metrology-grade mid-infrared spectroscopy for multi-dimensional perception

Abstract

The mid-infrared spectral window is essential for molecular fingerprinting and atmospheric sensing, yet unlocking its full potential is currently constrained by a fundamental instrumental trade-off: existing systems cannot simultaneously deliver broad bandwidth, high photon flux, and metrological frequency fidelity. Here, we resolve this bottleneck by demonstrating a metrology-grade spectroscopic system based on difference frequency generation, driven by widely tunable, near-infrared diode lasers traceable to atomic standards. Our system achieves continuous tunability across the 3-3.7 $\mu$m atmospheric window and delivers output power exceeding 45 mW with an absolute frequency accuracy of 7.2 MHz. We harness this convergence to overcome a critical barrier in integrated photonics, unambiguously identifying and eliminating hydrogen-induced absorption in silicon nitride microresonators to achieve an 88-fold reduction in optical loss. We further reveal multi-phonon absorption in the silica cladding as the fundamental limit to mid-infrared integrated photonics. Finally, we demonstrate the system's versatility through scattering-resilient LiDAR capable of penetrating optically dense fog, and dual-modality sensing that simultaneously retrieves target distance and chemical composition. By unifying the rigor of frequency metrology with the versatility of broadband sensing, this architecture establishes a new paradigm for multi-dimensional perception in complex environments.

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Baoqi Shi, Chenxi Zhang, Ming-Yang Zheng, Yue Hu, Zeying Zhong, Zhenyuan Shang, Wenbo Ma, Xiu-Ping Xie, Xue Bai, Yi-Han Luo, Anting Wang, Hairun Guo, Qiang Zhang, Junqiu Liu. 2026-02-01. Metrology-grade mid-infrared spectroscopy for multi-dimensional perception. https://arxiv.org/abs/2602.00958

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