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arXiv · 2601.07889

Achieving Ultrahigh Resolution with High Efficiency: Optical Design of the 2D-RIXS Spectrometer at NanoTerasu BL02U

Jun Miyawaki
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Abstract

A state-of-the-art Resonant Inelastic X-ray Scattering (RIXS) facility, composed of a dedicated beamline and a 2D-RIXS spectrometer, has been constructed and commissioned at BL02U in NanoTerasu, Japan. This paper reports the optical design and optimization of this spectrometer, aiming for an ultrahigh energy resolution of <10 meV in the soft X-ray range. Conventional RIXS spectrometers using monochromatic incident X-rays suffer from a severe trade-off between energy resolution and measurement efficiency, which makes achieving resolutions of <10 meV practically unfeasible. To overcome this limitation, we adopted the $h\nu^2$ concept using dispersive incident X-rays, based on a comparative study. This approach decouples the energy resolution from the incident bandwidth. We estimate that our 2D-RIXS spectrometer improves efficiency by more than a factor of 10 compared to conventional spectrometers. The 2D-RIXS spectrometer has been successfully commissioned, demonstrating that sub-10 meV resolution measurement is achievable with practical throughput. While development continues towards the ultimate design resolution, the successful implementation validates the design strategy and offers a pathway for future high-performance RIXS instrumentation.

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Jun Miyawaki. 2026-01-12. Achieving Ultrahigh Resolution with High Efficiency: Optical Design of the 2D-RIXS Spectrometer at NanoTerasu BL02U. https://arxiv.org/abs/2601.07889

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