Development of a new phase-retrieval algorithm from a single-shot image for X-ray schlieren microscopy

Ryutaro Nishimura; Yoshio Suzuki; Hiroshi Sugiyama; Daisuke Wakabayashi; Yuki Shibazaki; Keiichi Hirano; Noriyuki Igarashi; Nobumasa Funamori

doi:10.1016/j.optcom.2025.132283

arXiv · 2510.25264

Development of a new phase-retrieval algorithm from a single-shot image for X-ray schlieren microscopy

Ryutaro Nishimura·Yoshio Suzuki·Hiroshi Sugiyama·Daisuke Wakabayashi·Yuki Shibazaki·Keiichi Hirano·Noriyuki Igarashi·Nobumasa Funamori

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Abstract

In this paper, a new phase-retrieval algorithm from an X-ray schlieren image is proposed. The schlieren method allows phase-contrast imaging with an objective lens and a knife-edge filter placed at the back focal plane of the objective. This method finds a wide range of applications in the visible-light region for transparent specimen visualization. The schlieren contrast does not directly correspond to the phase shift. However, the phase map can be reconstructed from a single-shot schlieren image of a transparent and weak-phase object using the filtered Fourier transform method. A proof-of-principle experiment was performed in the hard-X-ray region at the AR-NE1A beamline of the Photon Factory facility at the High Energy Accelerator Research Organization (KEK).

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Ryutaro Nishimura, Yoshio Suzuki, Hiroshi Sugiyama, Daisuke Wakabayashi, Yuki Shibazaki, Keiichi Hirano, Noriyuki Igarashi, Nobumasa Funamori. 2025-10-29. Development of a new phase-retrieval algorithm from a single-shot image for X-ray schlieren microscopy. https://doi.org/10.1016/j.optcom.2025.132283

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