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arXiv · 2510.02574

A Physical Unclonable Function Based on Variations of Write Times in STT-MRAM due to Manufacturing Defects

Jacob Huber·Supriyo Bandyopadhyay
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Abstract

A physical unclonable function (PUF) utilizes the unclonable random variations in a device's responses to a set of inputs to produce a unique "biometric" that can be used for authentication. The variations are caused by unpredictable, unclonable and random manufacturing defects. Here, we show that the switching time of a magnetic tunnel junction injected with a spin-polarized current generating spin transfer torque is sensitive to the nature of structural defects introduced during manufacturing and hence can be the basis of a PUF. We use micromagnetic simulations to study the switching times under a constant current excitation for six different (commonly encountered) defect morphologies in spin-transfer-torque magnetic random access memory (STT-MRAM) to establish the viability of a PUF.

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Jacob Huber, Supriyo Bandyopadhyay. 2025-10-02. A Physical Unclonable Function Based on Variations of Write Times in STT-MRAM due to Manufacturing Defects. https://doi.org/10.1063/9.0000966

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