Full Two-Port S-Parameters at mK Temperatures: a Calibration Strategy and Uncertainty Budget

Luca Oberto; Ehsan Shokrolahzade; Emanuele Enrico; Luca Fasolo; Andrea Celotto; Bernardo Galvano; Alessandro Alocco; Paolo Terzi; Faisal A. Mubarak; Marco Spirito

arXiv · 2505.19922

Full Two-Port S-Parameters at mK Temperatures: a Calibration Strategy and Uncertainty Budget

Luca Oberto·Ehsan Shokrolahzade·Emanuele Enrico·Luca Fasolo·Andrea Celotto·Bernardo Galvano·Alessandro Alocco·Paolo Terzi·Faisal A. Mubarak·Marco Spirito

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Abstract

This paper describes the developed setup and characterization approach for full two-port calibrated S-parameter measurements at cryogenic temperatures, together with a complete uncertainty budget. The system developed at the Istituto Nazionale di Ricerca Metrologica (INRiM, Italy), exploits the Short-Open-Load-Reciprocal technique to realize error-corrected cryogenic measurements within a single cooling cycle. The system operates down to mK temperatures over the 4-12 GHz band in coaxial line. Calibration standards are referenced to SI-traceable room-temperature measurements, while a numerical approach is used to evaluate the response shift of the artifacts upon cooling and to derive an additional cryogenic uncertainty contribution for the measurement uncertainty budget. Moreover, relevant measurement uncertainty contributions are evaluated according to internationally agreed procedures, and a comprehensive uncertainty budget is presented. Test measurements on a 20 dB attenuator are shown as an example. An attenuation of 20.70 +/- 0.08 dB (95% confidence interval) was obtained at 6 GHz. Full SI-traceable verification at mK temperatures remains an open challenge; however, an initial calibration verification is also presented.

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Luca Oberto, Ehsan Shokrolahzade, Emanuele Enrico, Luca Fasolo, Andrea Celotto, Bernardo Galvano, Alessandro Alocco, Paolo Terzi, Faisal A. Mubarak, Marco Spirito. 2025-05-26. Full Two-Port S-Parameters at mK Temperatures: a Calibration Strategy and Uncertainty Budget. https://arxiv.org/abs/2505.19922

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