arXiv · 2505.08502
Demonstration of Advanced Timing Schemes in Time-Resolved X-ray Diffraction Measurements
Abstract
We present time-resolved X-ray diffraction measurements using advanced timing schemes that provide high temporal resolution while also maintaining a high flux in the X-ray probe beam. The method employs patterned probe pulse sequences that are generated with the WaveGate solid-state pulse picker. We demonstrate the feasibility of our method at two different beamlines on millisecond and microsecond timescales.
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Daniel Schmidt, David. v. Stetten, Michael Agthe, Arwen R. Pearson, Goddfrey . S. Beddard, Briony A. Yorke, Friedjof Tellkamp, Peter Gaal. 2025-05-13. Demonstration of Advanced Timing Schemes in Time-Resolved X-ray Diffraction Measurements. https://arxiv.org/abs/2505.08502
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