High-throughput Discovery of Anti-gap Semiconductors

Abstract

Conventional semiconductors typically have bonding states near the valence band maximum (VBM) and antibonding states near the conduction band minimum (CBM). Semiconductors with the opposite electronic configuration, namely an antibonding VBM and a bonding CBM, are here termed ``anti-gap semiconductors". They have been theoretically proposed to exhibit excellent optoelectronic properties because of their strong tolerance to defects. However, no anti-gap semiconductors have been identified so far, despite a known list of semiconductors with an antibonding VBM. Here, we use high-throughput computation to identify over 100 anti-gap semiconductors. From this group, we analyze the transition metal dichalcogenide MX$_2$ (M=Hf, Zr; X=S, Se) family in detail. In addition to verifying their defect tolerance for both electrons and holes using first-principles simulations, we also discovered that photoexcitation of charge carriers can lead to significant lattice stiffening and increased thermal conductivity in anti-gap semiconductors, which can be potentially used as photo-driven thermal switches. Our work analyzes the formation of the anti-gap electronic structure and showcases their unusual photoinduced lattice dynamics that can have a potential impact on their photophysical applications.