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arXiv · 2501.08961

Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization

Anna Charvátová Campbell·Petr Klapetek·Radek Šlesinger·Jan Martinek·Václav Hortvík·Viktor Witkovský·Gejza Wimmer
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Abstract

Scanning thermal microscopy is a unique tool for the study of thermal properties at the nanoscale. However, calibration of the method is a crucial problem. When analyzing local thermal conductivity, direct calibration is not possible and reference samples are used instead. As the calibration dependence is non-linear and there are only a few calibration points, this represents a metrological challenge that needs complex data processing. In this contribution we present use of the OEFPIL algorithm for robust and single-step evaluation of local thermal conductivities and their uncertainties, simplifying this procedure. Furthermore, we test the suitability of SThM calibration for automated measurement.

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Anna Charvátová Campbell, Petr Klapetek, Radek Šlesinger, Jan Martinek, Václav Hortvík, Viktor Witkovský, Gejza Wimmer. 2025-01-15. Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization. https://arxiv.org/abs/2501.08961

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