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arXiv · 2501.08901

Pattern Matching Workflows for EBSD Data Analysis: Quartz Chirality Mapping

Grzegorz Cios·Aimo Winkelmann·Tomasz Tokarski·Piotr Bała
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Abstract

Pattern matching approaches to electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM) provide qualitatively new possibilities for the microstructural analysis of chiral non-centrosymmetric phases due to the influence of dynamical electron diffraction effects on the formation of EBSD Kikuchi patterns. In the present study, we analyze the microstructure of polycrystalline alpha-quartz in an agate mineral sample. We identify characteristic intra-grain inversion domains of different handedness which are well-known from classical polarized light microscopy. As a result, the handedness-resolved microstructure of quartz can be imaged with the spatial and orientation resolution provided by EBSD in the SEM.

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Grzegorz Cios, Aimo Winkelmann, Tomasz Tokarski, Piotr Bała. 2025-01-15. Pattern Matching Workflows for EBSD Data Analysis: Quartz Chirality Mapping. https://arxiv.org/abs/2501.08901

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