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arXiv · 2407.09461

A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy

Ondrej Dyck·Olugbenga Olunloyo·Kai Xiao·Benjamin Wolf·Thomas M. Moore·Andrew R. Lupini·Stephen Jesse
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Abstract

We present the design and implementation of a side entry laser system designed for an ultra-high vacuum scanning transmission electron microscope. This system uses a versatile probe design enclosed in a vacuum envelope such that parts can be easily aligned, modified, or exchanged without disturbing the vacuum. The system uses a mirror mounted on the sample holder such that the sample can be illuminated without being tilted. Notably the mirror can be removed and replaced with an ablation target and a higher power laser used to ablate material directly onto the sample. We argue that new capabilities hold the potential to transform the electron microscope from an analysis tool towards a more flexible synthesis system, where atomic scale fabrication and atom-by-atom experiments can be performed.

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Ondrej Dyck, Olugbenga Olunloyo, Kai Xiao, Benjamin Wolf, Thomas M. Moore, Andrew R. Lupini, Stephen Jesse. 2024-07-12. A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy. https://arxiv.org/abs/2407.09461

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