Characterising and tackling thermally induced zero-drift in displacement measuring interferometry using temperature-controlled enclosure

Abstract

Our research efforts in displacement measurement interferometry focused on long-term drifts initiated an extended experimental investigation in the interferometric assemblies of our design. We aimed to analyze, characterize and tackle the long-term measurement stability, expressed as the zero-drift, with particular attention to the thermal effects. For the experimentation, we developed a thermostatic chamber equipped with active temperature regulation, an array of sensors and control electronics. With either the finely stabilized temperature or with the thermal cycling, we can carry out a range of investigations: verification of modified design or prototype interferometers, testing of production pieces, characterization of integrated assemblies and units in terms of the zero drift and the susceptibility to thermal effects -- the temperature sensitivity ($\delta L / \delta T$, expressed in nm.K$^{-1}$). With these experimental studies, we demonstrate the potential of the zero drift studies to contribute to the development and broader expansion of interferometric instrumentation.