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arXiv · 2403.18884

Nanoscale Dark-Field Imaging in Full-Field Transmission X-Ray Microscopy

Sami Wirtensohn·Peng Qi·Christian David·Julia Herzen·Imke Greving·Silja Flenner
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Abstract

The dark-field signal uncovers details beyond conventional X-ray attenuation contrast, which is especially valuable for material sciences. In particular, dark-field techniques are able to reveal structures beyond the spatial resolution of a setup. However, its implementation is yet limited to the micrometer regime. Therefore, we propose a technique to extend full-field transmission X-ray microscopy by the dark-field signal. The proposed method is based on a well-defined illumination of a beam-shaping condenser, which allows to block the bright-field by motorized apertures in the back focal plane of the objective's lens. This method offers a simple implementation and enables rapid modality changes while maintaining short scan times, making dark-field imaging widely available at the nanometer scale.

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Sami Wirtensohn, Peng Qi, Christian David, Julia Herzen, Imke Greving, Silja Flenner. 2024-03-27. Nanoscale Dark-Field Imaging in Full-Field Transmission X-Ray Microscopy. https://doi.org/10.1364/optica.524812

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