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arXiv · 2403.17427

Atomic observation on diamond (001) surfaces with non-contact atomic force microscopy

Runnan Zhang·Yuuki Yasui·Masahiro Fukuda·Taisuke Ozaki·Masahiko Ogura·Toshiharu Makino·Daisuke Takeuchi·Yoshiaki Sugimoto
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Abstract

To achieve atomic-level characterization of the diamond (001) surface, persistent efforts have been made over the past few decades. The motivation behind the pursuit extends beyond investigating surface defects and adsorbates; it also involves unraveling the mystery of the smooth growth of diamond. However, the inherently low conductivity and the short C-C bonds render atomic resolution imaging exceptionally challenging. Here, we successfully overcame these challenges by employing non-contact atomic force microscopy with reactive Si tips. Atomic resolution imaging was achieved even at room temperature. With density-functional-theory calculations, we clarified that the critical factors for atomic resolution are in the formation of tilted C-Si bonds between scanning probes and surfaces, along with reordering of the surface C-C dimers. Implications of the findings extend beyond the realm of surface characterization. The present atomic-resolution microscopies drive future advancements in diamond technologies by providing avenues for identifying dopants and constructing artificial nanostructures.

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Runnan Zhang, Yuuki Yasui, Masahiro Fukuda, Taisuke Ozaki, Masahiko Ogura, Toshiharu Makino, Daisuke Takeuchi, Yoshiaki Sugimoto. 2024-03-26. Atomic observation on diamond (001) surfaces with non-contact atomic force microscopy. https://arxiv.org/abs/2403.17427

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