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arXiv · 2403.09550

TCAD Simulations of Humidity-Induced Breakdown of Silicon Sensors

Ilona-Stefana Ninca·Ingo Bloch·Ben Bruers·Vitaliy Fadeyev·Xavi Fernandez-Tejero·Callan Jessiman·John Stakely Keller·Christoph Thomas Klein·Thomas Koffas·Heiko Markus Lacker·Peilin Li·Christian Scharf·Ezekiel Staats·Miguel Ullan·Yoshinobu Unno
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Abstract

The breakdown voltage of silicon sensors is known to be affected by the ambient humidity. To understand the sensor's humidity sensitivity, Synopsys TCAD was used to simulate n-in-p sensors for different effective relative humidities. Photon emission of hot electrons was imaged with a microscope to locate breakdown in the edge-region of the sensor. The Top-Transient Current Technique was used to measure charge transport near the surface in the breakdown region of the sensor. Using the measurements and simulations, the evolution of the electric field with relative humidity and the carrier densities towards breakdown in the periphery of p-bulk silicon sensors are investigated.

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Ilona-Stefana Ninca, Ingo Bloch, Ben Bruers, Vitaliy Fadeyev, Xavi Fernandez-Tejero, Callan Jessiman, John Stakely Keller, Christoph Thomas Klein, Thomas Koffas, Heiko Markus Lacker, Peilin Li, Christian Scharf, Ezekiel Staats, Miguel Ullan, Yoshinobu Unno. 2024-03-14. TCAD Simulations of Humidity-Induced Breakdown of Silicon Sensors. https://arxiv.org/abs/2403.09550

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