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arXiv · 2402.17225

Fourier analysis of near-field patterns generated by propagating polaritons

Minsoo Jang·Sergey G. Menabde·Fatemeh Kiani·Jacob T. Heiden·Vladimir A. Zenin·N. Asger Mortensen·Giulia Tagliabue·Min Seok Jang
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Abstract

Scattering-type scanning near-field optical microscope (s-SNOM) has become an essential tool to study polaritons - quasiparticles of light coupled to collective charge oscillations - via direct probing of their near field with a spatial resolution far beyond the diffraction limit. However, extraction of the polariton complex propagation constant from the near-field images requires subtle considerations that have not received necessary attention so far. In this study, we discuss important yet overlooked aspects of the near-field analysis. First, we experimentally demonstrate that the sample orientation inside the s-SNOM may significantly affect the near-field interference pattern of mid-infrared polaritons, leading to an error in momentum measurement up to 7.7% even for the modes with effective index of 12.5. Second, we establish a methodology to correctly extract the polariton damping rate from the interference fringes depending on their origin - the s-SNOM nano-tip or the material edge. Overall, our work provides a unified framework for the accurate extraction of the polariton momentum and damping from the near-field interference fringes.

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Minsoo Jang, Sergey G. Menabde, Fatemeh Kiani, Jacob T. Heiden, Vladimir A. Zenin, N. Asger Mortensen, Giulia Tagliabue, Min Seok Jang. 2024-02-29. Fourier analysis of near-field patterns generated by propagating polaritons. https://doi.org/10.1103/physrevapplied.22.014076

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