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arXiv · 2402.11045

Standardization of chemically selective atomic force microscopy for metal-oxide surfaces

Philipp Wiesener·Stefan Förster·Milena Merkel·Bertram Schulze Lammers·Harald Fuchs·Saeed Amirjalayer·Harry Mönig
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Abstract

The complex atomic structures and defects of metal-oxide surfaces are vital for a variety of applications in material science and chemistry. While scanning probe microscopy allows accessing atomic-scale structures in real space, elemental discrimination and defect characterization usually rely on indirect assumptions and extensive theoretical modelling. By investigating a variety of different sample systems with increasing structural complexity and inherent defects, we demonstrate that noncontact atomic force microscopy with an O-terminated copper tip allows imaging metal-oxide surfaces with a clear elemental contrast. This universal approach provides not only immediate access to the metal- and oxygen sub-lattices, but also to the chemical and structural configuration of atomic-scale defect structures. The observed contrast can be explained by purely electrostatic interactions between the negatively charged tip apex and the strongly varying electrostatic potential between metal- and oxygen surface sites. These results offer a standardized methodology for the direct structural characterization of even most-complex metal-oxide surfaces, which is highly relevant for a fundamental understanding of atomic-scale processes on these material systems.

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Philipp Wiesener, Stefan Förster, Milena Merkel, Bertram Schulze Lammers, Harald Fuchs, Saeed Amirjalayer, Harry Mönig. 2024-02-16. Standardization of chemically selective atomic force microscopy for metal-oxide surfaces. https://doi.org/10.1021/acsnano.4c03155

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