Memory switching due to thermal noise in amorphous solids subject to cyclic shear

Abstract

The discovery that memory of particle configurations and plastic events can be stored in amorphous solids subject to oscillatory shear has spurred research into methods for storing and retrieving information from these materials. However, it is unclear to what extent the ability to store memory is affected by thermal fluctuations and other environmental noises, which are expected to be relevant in realistic situations. Here, we show that while memory has a long lifetime at low temperatures, thermal fluctuations eventually lead to a catastrophic loss of memory, resulting in the erasure of most or all of the stored information within a few forcing cycles. We observe that an escape from the memory-retaining state (limit cycle) is triggered by a change in the switching of plastic events, leading to a cascade of new plastic events that were not present in the original limit cycle. The displacements from the new plastic events change the particle configuration which leads to the loss of memory. We further show that the rate of escaping from a limit cycle increases in a non-Arrhenius manner as a function of temperature, and the probability of staying in a limit cycle decays exponentially with an increase in the shearing frequency. These results have important implications for memory storage since increasing the temperature offers a means of effectively erasing existing memories and allowing for the imprinting of new ones that can then be stored for a long time at low temperatures.