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arXiv · 2211.05247

Automating Dislocation Characterization in 3D Dark Field X-ray Microscopy

Pin-Hua Huang·Ryan Coffee·Leora Dresselhaus-Marais
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Abstract

Mechanical properties in crystals are strongly correlated to the arrangement of 1D line defects, termed dislocations. Recently, Dark field X-ray Microscopy (DFXM) has emerged as a new tool to image and interpret dislocations within crystals using multidimensional scans. However, the methods required to reconstruct meaningful dislocation information from high-dimensional DFXM scans are still nascent and require significant manual oversight (i.e. \textit{supervision}). In this work, we present a new relatively unsupervised method that extracts dislocation-specific information (features) from a 3D dataset ($x$, $y$, $\phi$) using Gram-Schmidt orthogonalization to represent the large dataset as an array of 3-component feature vectors for each position, corresponding to the weak-beam conditions and the strong-beam condition. This method offers key opportunities to significantly reduce dataset size while preserving only the crystallographic information that is important for data reconstruction.

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Pin-Hua Huang, Ryan Coffee, Leora Dresselhaus-Marais. 2022-11-09. Automating Dislocation Characterization in 3D Dark Field X-ray Microscopy. https://doi.org/10.1007/s40192-023-00295-6

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