arXiv · 2208.01247
X-ray speed reading: enabling fast, low noise readout for next-generation CCDs
Abstract
Current, state-of-the-art CCDs are close to being able to deliver all key performance figures for future strategic X-ray missions except for the required frame rates. Our Stanford group is seeking to close this technology gap through a multi-pronged approach of microelectronics, signal processing and novel detector devices, developed in collaboration with the Massachusetts Institute of Technology (MIT) and MIT Lincoln Laboratory (MIT-LL). Here we report results from our (integrated) readout electronics development, digital signal processing and novel SiSeRO (Single electron Sensitive Read Out) device characterization.
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S. Herrmann, P. Orel, T. Chattopadhyay, R. G. Morris, G. Prigozhin, K. Donlon, R. Foster, M. Bautz, S. Allen, C. Leitz. 2022-08-02. X-ray speed reading: enabling fast, low noise readout for next-generation CCDs. https://arxiv.org/abs/2208.01247
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