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arXiv · 2206.10242

An iterative method for reference pattern selection in high resolution electron backscatter diffraction (HR-EBSD)

Abdalrhaman Koko·Vivian Tong·Angus J. Wilkinson·T. James Marrow
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Abstract

For high (angular) resolution electron backscatter diffraction (HR-EBSD), the selection of a reference diffraction pattern (EBSP0) significantly affects the precision of the calculated strain and rotation maps. This effect was demonstrated in plastically deformed body-centred cubic and face-centred cubic ductile metals (ferrite and austenite grains in duplex stainless steel) and brittle single-crystal silicon, which showed that the effect is not only limited to measurement magnitude but also spatial distribution. An empirical relationship was then identified between the cross-correlation parameter and angular error, which was used in an iterative algorithm to identify the optimal reference pattern that maximises the precision of HR-EBSD.

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Abdalrhaman Koko, Vivian Tong, Angus J. Wilkinson, T. James Marrow. 2023-01-16. An iterative method for reference pattern selection in high resolution electron backscatter diffraction (HR-EBSD). https://doi.org/10.1016/j.ultramic.2023.113705

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