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arXiv · 2205.01916

Identifying diverging-effective mass in MOSFET and $^3$He systems

Hyun-Tak Kim
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Abstract

Emerging devices such as a neuromorphic device and a qubit can use the Mott transition phenomenon, but in particular, the diverging mechanism of the phenomenon remains to be clarified. The diverging-effective mass near Mott insulators was measured in strongly correlated Mott systems such as a fermion $^3$He and a Si metal-oxide-semiconductor-field-effect transistor, and is closely fitted by the effective mass obtained by the extension of the Brinkman-Rice(BR) picture, $m^*/m=1/[1-(U/U_c)^2]=1/(1-{\kappa}^2_{BR}{\rho}^4)$ when ${\kappa}^2_{BR}{\approx}1({\neq}$1), where $0<U/U_c={\kappa}_{BR}{\rho}^2<1$, correlation strength is ${\kappa}_{BR}$, band-filling is ${\rho}$. Its identification is a percolation of a constant mass in the Brinkman-Rice picture. Over ${\kappa}_{BR}{\approx}0.96$ is evaluated.

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Hyun-Tak Kim. 2022-05-04. Identifying diverging-effective mass in MOSFET and $^3$He systems. https://arxiv.org/abs/2205.01916

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