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arXiv · 2204.08739

Characterization of timing and spacial resolution of novel TI-LGAD structures before and after irradiation

Matias Senger·Ashish Bisht·Giacomo Borghi·Maurizio Boscardin·Matteo Centis Vignali·Federico Ficorella·Omar Hammad Ali·Ben Kilminster·Anna Macchiolo·Giovanni Paternoster
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Abstract

The characterization of spacial and timing resolution of the novel Trench Isolated LGAD (TI-LGAD) technology is presented. This technology has been developed at FBK with the goal of achieving 4D pixels, where an accurate position resolution is combined in a single device with the precise timing determination for Minimum Ionizing Particles (MIPs). In the TI-LGAD technology, the pixelated LGAD pads are separated by physical trenches etched in the silicon. This technology can reduce the interpixel dead area, mitigating the fill factor problem. The TI-RD50 production studied in this work is the first one of pixelated TI-LGADs. The characterization was performed using a scanning TCT setup with an infrared laser and a $^{90}$Sr source setup.

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Matias Senger, Ashish Bisht, Giacomo Borghi, Maurizio Boscardin, Matteo Centis Vignali, Federico Ficorella, Omar Hammad Ali, Ben Kilminster, Anna Macchiolo, Giovanni Paternoster. 2022-04-19. Characterization of timing and spacial resolution of novel TI-LGAD structures before and after irradiation. https://doi.org/10.1016/j.nima.2022.167030

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