Registration-free localization of defects in 3-D parts from mesh metrology data using functional maps

Abstract

Spectral Laplacian methods, widely used in computer graphics and manifold learning, have been recently proposed for the Statistical Process Control (SPC) of a sequence of manufactured parts, whose 3-dimensional metrology is acquired with non-contact sensors. These techniques provide an {\em intrinsic} solution to the SPC problem, that is, a solution exclusively based on measurements on the scanned surfaces or 2-manifolds without making reference to their ambient space. These methods, therefore, avoid the computationally expensive, non-convex registration step needed to align the parts, as required by previous methods for SPC based on 3-dimensional measurements. Once a SPC mechanism triggers and out-of-control alarm, however, an additional problem remains: that of locating where on the surface of the part that triggered the SPC alarm there is a significant shape difference with respect to either an in-control part or its nominal (CAD) design. In the past, only registration-based solutions existed for this problem. In this paper, we present a new registration-free solution to the part localization problem. Our approach uses a functional map between the manifolds to be compared, that is, a map between functions defined on each manifold based on intrinsic differential operators, in particular, the Laplace-Beltrami operator, in order to construct a point to point mapping between the two manifolds and be able to locate defects on the suspected part. A recursive partitioning algorithm is presented to define a region of interest on the surface of the part where defects are likely to occur, which results in considerable computational advantages. The functional map method involves a very large number of point-to-point comparisons based on noisy measurements, and a statistical thresholding method is presented to filter the false positives in the underlying massive multiple comparisons problem.