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arXiv · 2104.09992

A Scanning 2-Grating Free Electron Mach-Zehnder Interferometer

Cameron W. Johnson·Amy E. Turner·Benjamin J. McMorran
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Abstract

We demonstrate a 2-grating free electron Mach-Zehnder interferometer constructed in a transmission electron microscope. A symmetric binary phase grating and condenser lens system forms two spatially separated, focused probes at the sample which can be scanned while maintaining alignment. The two paths interfere at a second grating, creating in constructive or destructive interference in output beams. This interferometer has many notable features: positionable probe beams, large path separations relative to beam width, continuously tunable relative phase between paths, and real-time phase information. Here we use the electron interferometer to measure the relative phase shifts imparted to the electron probes by electrostatic potentials as well as a demonstration of quantitative nanoscale phase imaging of a polystyrene latex nanoparticle.

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Cameron W. Johnson, Amy E. Turner, Benjamin J. McMorran. 2021-04-16. A Scanning 2-Grating Free Electron Mach-Zehnder Interferometer. https://doi.org/10.1103/physrevresearch.3.043009

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