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arXiv · 2011.04375

Low-frequency critical current noise in graphene Josephson junctions in the open-circuit gate voltage limit

Francesco M. D. Pellegrino·Giuseppe Falci·Elisabetta Paladino
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Abstract

We investigate critical current noise in short ballistic graphene Josephson junctions in the open-circuit gate-voltage limit within the McWorther model. We find flicker noise in a wide frequency range and discuss the temperature dependence of the noise amplitude as a function of the doping level. At the charge neutrality point we find a singular temperature dependence $T^{-3}$, strikingly different from the linear dependence expected for short ballistic graphene Josephson junctions under fixed gate voltage.

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Francesco M. D. Pellegrino, Giuseppe Falci, Elisabetta Paladino. 2020-11-16. Low-frequency critical current noise in graphene Josephson junctions in the open-circuit gate voltage limit. https://doi.org/10.1140/epjs%2Fs11734-021-00071-7

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