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arXiv · 2010.12624

a-axis YBa2Cu3O7-x/PrBa2Cu3O7-x/YBa2Cu3O7-x trilayers with subnanometer rms roughness

Y. Eren Suyolcu·Jiaxin Sun·Berit H. Goodge·Jisung Park·Jürgen Schubert·Lena F. Kourkoutis·Darrell G. Schlom
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Abstract

We demonstrate a-axis YBa2Cu3O7-x/PrBa2Cu3O7-x/YBa2Cu3O7-x trilayers grown on (100) LaAlO3 substrates with improved interface smoothness. The trilayers are synthesized by ozone-assisted molecular-beam epitaxy. The thickness of the PrBa2Cu3O7-x layer is held constant at 8 nm and the thickness of the YBa2Cu3O7-x layers is varied from 24 nm to 100 nm. X-ray diffraction measurements show all trilayers to have >95% a-axis content. The rms roughness of the thinnest trilayer is < 0.7 nm and this roughness increases with the thickness of the YBa2Cu3O7-x layers. The thickness of the YBa2Cu3O7-x layers also affects the transport properties: while all samples exhibit an onset of the superconducting transition at and above 85 K, the thinner samples show wider transition widths, {\Delta}Tc. High-resolution scanning transmission electron microscopy reveals coherent and chemically sharp interfaces, and that growth begins with a cubic (Y,Ba)CuO3-x perovskite phase that transforms into a-axis oriented YBa2Cu3O7-x as the substrate temperature is ramped up.

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Y. Eren Suyolcu, Jiaxin Sun, Berit H. Goodge, Jisung Park, Jürgen Schubert, Lena F. Kourkoutis, Darrell G. Schlom. 2020-10-23. a-axis YBa2Cu3O7-x/PrBa2Cu3O7-x/YBa2Cu3O7-x trilayers with subnanometer rms roughness. https://doi.org/10.1063/5.0034648

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