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arXiv · 2010.07566

RF Reflectometry for Readout of Charge Transition in a Physically Defined PMOS Silicon Quantum Dot

Sinan Bugu·Shimpei Nishiyama·Kimihiko Kato·Yongxun Liu·Takahiro Mori·Tetsuo Kodera
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Abstract

We have embedded a physically defined p-channel silicon MOS quantum dot (QD) device into an impedance transformer RC circuit. To decrease the parasitic capacitance and surpass the cutoff frequency of the device which emerges in MOS devices that have a top gate and act as RC low-pass filter, we fabricate a new device to reduce the device's top gate area from 400 $\mbox{$\mu$m}^2$ to 0.09 $\mbox{$\mu$m}^2$. Having a smaller top gate eliminates the cutoff frequency problem preventing the RF signal from reaching QD. We show that we have fabricated a single QD properly, which is essential for RF single-electron transistor technique. We also analyze and improve the impedance matching condition and show that it is possible to perform readout of charge transition at 4.2 K by RF reflectometry, which will get us to fast readout of charge and spin states.

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Sinan Bugu, Shimpei Nishiyama, Kimihiko Kato, Yongxun Liu, Takahiro Mori, Tetsuo Kodera. 2020-10-15. RF Reflectometry for Readout of Charge Transition in a Physically Defined PMOS Silicon Quantum Dot. https://doi.org/10.35848/1347-4065/abeac1

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