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arXiv · 2004.14688

Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties

Alexander J. Leide·Richard I. Todd·David E. J. Armstrong
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Abstract

Ion implantation is widely used as a surrogate for neutron irradiation in the investigation of radiation damage on the properties of materials. Due to the small depth of damage, micromechanical methods must be used to extract material properties. In this work, nanoindentation has been applied to ion irradiated silicon carbide to extract radiation-induced hardening. Residual stress is evaluated using HR-EBSD, AFM swelling measurements, and a novel microcantilever relaxation technique coupled with finite element modelling. Large compressive residual stresses of several GPa are found in the irradiated material, which contribute to the significant hardening observed in nanoindentation measurements. The origin of these residual stresses and the associated hardening is the unirradiated substrate which constrains radiation swelling. Comparisons with other materials susceptible to irradiation swelling show that this effect should not be neglected in studying the effects of ion irradiation damage on mechanical properties. This constraint may also be influencing fundamental radiation defects. This has significant implications for the suitability of ion implantation as a surrogate for neutron irradiations. These results demonstrate the significance of swelling-induced residual stresses in nuclear reactor components, and the impact on structural integrity of reactor components.

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Alexander J. Leide, Richard I. Todd, David E. J. Armstrong. 2020-04-30. Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties. https://doi.org/10.1016/j.actamat.2020.06.030

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