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arXiv · 1912.05432

X-ray optics and beam characterisation using random modulation: Experiments

Sebastien Berujon·Ruxandra Cojocaru·Pierre Piault·Rafael Celestre·Thomas Roth·Raymond Barrett·Eric Ziegler
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Abstract

In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.

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Sebastien Berujon, Ruxandra Cojocaru, Pierre Piault, Rafael Celestre, Thomas Roth, Raymond Barrett, Eric Ziegler. 2019-12-03. X-ray optics and beam characterisation using random modulation: Experiments. https://doi.org/10.1107/s1600577520000508

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