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arXiv · 1906.09215

Long Term Logarithmic Annealing in p-MNOS RADFETs and Renormalization of Relaxation Parameters

G. I. Zebrev·P. A. Zimin·E. V. Mrozovskaya·V. A. Yushkova·V. S. Anashin·P. A. Chubunov
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Abstract

It was experimentally shown that annealing (fading) of the pMNOS based dosimeters has close to logarithmic temporal dependence during and after irradiation. The results are shown to be consistent with the previously proposed model.

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G. I. Zebrev, P. A. Zimin, E. V. Mrozovskaya, V. A. Yushkova, V. S. Anashin, P. A. Chubunov. 2019-06-21. Long Term Logarithmic Annealing in p-MNOS RADFETs and Renormalization of Relaxation Parameters. https://arxiv.org/abs/1906.09215

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