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arXiv · 1904.11064

Design for a 10 KeV Multi-Pass Transmission Electron Microscope

Stewart A. Koppell·Marian Mankos·Adam J. Bowman·Yonatan Israel·Thomas Juffmann·Brannon B. Klopfer·Mark A. Kasevich
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Abstract

Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple times. A linear approximation for the multi-pass contrast transfer function (CTF) is developed to explain how the resolution depends on the number of passes through the sample.

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Stewart A. Koppell, Marian Mankos, Adam J. Bowman, Yonatan Israel, Thomas Juffmann, Brannon B. Klopfer, Mark A. Kasevich. 2019-04-24. Design for a 10 KeV Multi-Pass Transmission Electron Microscope. https://arxiv.org/abs/1904.11064

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