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arXiv · 1710.10239

Optically Coupled Methods for Microwave Impedance Microscopy

Scott R. Johnston·Eric Yue Ma·Zhi-Xun Shen
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Abstract

Scanning Microwave Impedance Microscopy (MIM) measurement of photoconductivity with 50 nm resolution is demonstrated using a modulated optical source. The use of a modulated source allows for measurement of photoconductivity in a single scan without a reference region on the sample, as well as removing most topographical artifacts and enhancing signal to noise as compared with unmodulated measurement. A broadband light source with tunable monochrometer is then used to measure energy resolved photoconductivity with the same methodology. Finally, a pulsed optical source is used to measure local photo-carrier lifetimes via MIM, using the same 50 nm resolution tip.

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Scott R. Johnston, Eric Yue Ma, Zhi-Xun Shen. 2017-10-27. Optically Coupled Methods for Microwave Impedance Microscopy. https://doi.org/10.1063/1.5011391

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