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arXiv · 1710.00340

Measurement of the surface susceptibility and the surface conductivity of atomically thin $\rm MoS_2$ by spectroscopic ellipsometry

Gaurav Jayaswal·Zhenyu Dai·Xixiang Zhang·Mirko Bagnarol·Alessandro Martucci·Michele Merano
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Abstract

We show how to correctly extract from the ellipsometric data the surface susceptibility and the surface conductivity that describe the optical properties of monolayer $\rm MoS_2$. Theoretically, these parameters stem from modelling a single-layer two-dimensional crystal as a surface current, a truly two-dimensional model. Currently experimental practice is to consider this model equivalent to a homogeneous slab with an effective thickness given by the interlayer spacing of the exfoliating bulk material. We prove that the error in the evaluation of the surface susceptibility of monolayer $\rm MoS_2$, owing to the use of the slab model, is at least 10% or greater, a significant discrepancy in the determination of the optical properties of this material.

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Gaurav Jayaswal, Zhenyu Dai, Xixiang Zhang, Mirko Bagnarol, Alessandro Martucci, Michele Merano. 2017-10-01. Measurement of the surface susceptibility and the surface conductivity of atomically thin $\rm MoS_2$ by spectroscopic ellipsometry. https://doi.org/10.1364/ol.43.000703

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