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arXiv · 1609.07801

Resolving and Tuning Mechanical Anisotropy in Black Phosphorus via Nanomechanical Multimode Resonance Spectromicroscopy

Zenghui Wang·Hao Jia·Xu-Qian Zheng·Rui Yang·G. J. Ye·X. H. Chen·Philip X. -L. Feng
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Abstract

Black phosphorus (P) has emerged as a layered semiconductor with a unique crystal structure featuring corrugated atomic layers and strong in-plane anisotropy in its physical properties. Here, we demonstrate that the crystal orientation and mechanical anisotropy in free-standing black P thin layers can be precisely determined by spatially resolved multimode nanomechanical resonances. This offers a new means for resolving important crystal orientation and anisotropy in black P device platforms in situ beyond conventional optical and electrical calibration techniques. Furthermore, we show that electrostatic-gating-induced straining can continuously tune the mechanical anisotropic effects on multimode resonances in black P electromechanical devices. Combined with finite element modeling (FEM), we also determine the Young's moduli of multilayer black P to be 116.1 and 46.5 GPa in the zigzag and armchair directions, respectively.

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Zenghui Wang, Hao Jia, Xu-Qian Zheng, Rui Yang, G. J. Ye, X. H. Chen, Philip X. -L. Feng. 2016-09-25. Resolving and Tuning Mechanical Anisotropy in Black Phosphorus via Nanomechanical Multimode Resonance Spectromicroscopy. https://doi.org/10.1021/acs.nanolett.6b01598

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