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arXiv · 1605.06584

Amplitude dependence of image quality in atomically-resolved bimodal atomic microscopy

Hiroaki Ooe·Dominik Kirpal·Daniel S. Wastl·Alfred J. Weymouth·Toyoko Arai·Franz J. Giessibl
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Abstract

In bimodal FM-AFM, two flexural modes are excited simultaneously. The total vertical oscillation deflection range of the tip is the sum of the peak-to-peak amplitudes of both flexural modes (sum amplitude). We show atomically resolved images of KBr(100) in ambient conditions in bimodal AFM that display a strong correlation between image quality and sum amplitude. When the sum amplitude becomes larger than about 200 pm, the signal-to-noise ratio (SNR) is drastically decreased. We propose this is caused by the temporary presence of one or more water layers in the tip-sample gap. These water layers screen the short range interaction and must be displaced with each oscillation cycle. Further decreasing the sum amplitude, however, causes a decrease in SNR. Therefore, the highest SNR in ambient conditions is achieved when the sum amplitude is slightly less than the thickness of the primary hydration layer.

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Hiroaki Ooe, Dominik Kirpal, Daniel S. Wastl, Alfred J. Weymouth, Toyoko Arai, Franz J. Giessibl. 2016-05-21. Amplitude dependence of image quality in atomically-resolved bimodal atomic microscopy. https://doi.org/10.1063/1.4964125

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