A metric interpretation of reflexivity for Banach spaces

Abstract

We define two metrics $d_{1,α}$ and $d_{\infty,α}$ on each Schreier family $\mathcal{S}_α$, $α<ω_1$, with which we prove the following metric characterization of reflexivity of a Banach space $X$: $X$ is reflexive if and only if there is an $α<ω_1$, so that there is no mapping $Φ:\mathcal{S}_α\to X$ for which $$ cd_{\infty,α}(A,B)\le \|Φ(A)-Φ(B)\|\le C d_{1,α}(A,B) \text{ for all $A,B\in\mathcal{S}_α$.}$$ Secondly, we prove for separable and reflexive Banach spaces $X$, and certain countable ordinals $α$ that $\max(\text{ Sz}(X),\text{ Sz}(X^*))\le α$ if and only if $({\mathcal S}_α, d_{1,α})$ does not bi-Lipschitzly embed into $X$. Here $\text{Sz}(Y)$ denotes the Szlenk index of a Banach space $Y$.