arXiv · 1601.05930
Robust topological edge states at the perfect surface step edge of topological insulator ZrTe$_5$
Abstract
We report an atomic-scale characterization of ZrTe$_5$ by using scanning tunneling microscopy. We observe a bulk bandgap of ~80 meV with topological edge states at the step edge, and thus demonstrate ZrTe$_5$ is a two dimensional topological insulator. It is also found that an applied magnetic field induces energetic splitting and spatial separation of the topological edge states, which can be attributed to a strong link between the topological edge states and bulk topology. The perfect surface steps and relatively large bandgap make ZrTe$_5$ be a potential candidate for future fundamental studies and device applications.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Xiang-Bing Li, Wen-Kai Huang, Yang-Yang Lv, Kai-Wen Zhang, Chao-Long Yang, Bin-Bin Zhang, Y. B. Chen, Shu-Hua Yao, Jian Zhou, Ming-Hui Lu, Li Sheng, Shao-Chun Li, Jin-Feng Jia, Qi-Kun Xue, Yan-Feng Chen, Dingyu Xing. 2016-01-22. Robust topological edge states at the perfect surface step edge of topological insulator ZrTe$_5$. https://doi.org/10.1103/physrevlett.116.176803
Cite the original work for its findings. Save a collection to share your selection of sources.