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arXiv · 1601.01481

Near-field to far-field characterization of speckle patterns generated by disordered nanomaterials

Valentina Parigi·Elodie Perros·Guillaume Binard·Céline Bourdillon·Agnès Maître·Rémi Carminati·Valentina Krachmalnicoff·Yannick De Wilde
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Abstract

We study the intensity spatial correlation function of optical speckle patterns above a disordered dielectric medium in the multiple scattering regime. The intensity distributions are recorded by scanning near-field optical microscopy (SNOM) with sub-wavelength spatial resolution at variable distances from the surface in a range which spans continuously from the near-field (distance $ \ll λ$) to the far-field regime (distance $\gg λ$). The non-universal behavior at sub-wavelength distances reveals the connection between the near-field speckle pattern and the internal structure of the medium.

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Valentina Parigi, Elodie Perros, Guillaume Binard, Céline Bourdillon, Agnès Maître, Rémi Carminati, Valentina Krachmalnicoff, Yannick De Wilde. 2016-01-07. Near-field to far-field characterization of speckle patterns generated by disordered nanomaterials. https://doi.org/10.1364/oe.24.007019

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