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arXiv · 1509.03102

The electronic structure formation of CuxTiSe2 in a wide range (0.04 < x < 0.8) of copper concentration

A. S. Shkvarin·Yu. M. Yarmoshenko·M. V. Yablonskikh·A. I. Merentsov·E. G. Shkvarina·A. A. Titov·A. N. Titov
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Abstract

An experimental study of the electronic structure of copper intercalated titanium dichalcogenides in a wide range of copper concentrations (x = 0.05 - 0.6) using the x-rays photoemission spectroscopy, resonant photoemission and x-rays absorption spectroscopy has been performed. Negative energy shifts of the Ti 2p and Se 3d core levels spectra and a corresponding decrease of the photon energy in Ti 2p absorption spectra with increasing concentration of copper have been found. Such sign-anomalous shifts may be explained by the shielding effect of the corresponding atomic shells as a result of the dynamic charge transfer during the formation of a covalent chemical bond between the copper atoms and the TiSe2 matrix.

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A. S. Shkvarin, Yu. M. Yarmoshenko, M. V. Yablonskikh, A. I. Merentsov, E. G. Shkvarina, A. A. Titov, A. N. Titov. 2015-09-10. The electronic structure formation of CuxTiSe2 in a wide range (0.04 < x < 0.8) of copper concentration. https://doi.org/10.1063/1.4941767

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