arXiv · 1508.07301
Observation of Ultrafast Free Carrier Dynamics in Single Layer MoS$_2$
Abstract
The dynamics of excited electrons and holes in single layer (SL) MoS$_2$ have so far been difficult to disentangle from the excitons that dominate the optical response of this material. Here, we use time- and angle-resolved photoemission spectroscopy for a SL of MoS$_2$ on a metallic substrate to directly measure the excited free carriers. This allows us to ascertain a direct quasiparticle band gap of 1.95 eV and determine an ultrafast (50 fs) extraction of excited free carriers via the metal in contact with the SL MoS$_2$. This process is of key importance for optoelectronic applications that rely on separated free carriers rather than excitons.
Explore related subjects
Keep this discovery
Antonija Grubišić Čabo, Jill A. Miwa, Signe S. Grønborg, Jonathon M. Riley, Jens C. Johannsen, Cephise Cacho, Oliver Alexander, Richard T. Chapman, Emma Springate, Marco Grioni, Jeppe V. Lauritsen, Phil D. C. King, Philip Hofmann, Søren Ulstrup. 2015-08-28. Observation of Ultrafast Free Carrier Dynamics in Single Layer MoS$_2$. https://doi.org/10.1021/acs.nanolett.5b01967
Cite the original work for its findings. Save a collection to share your selection of sources.