Photoemission System with Polarized Hard X-rays for Probing Ground State Symmetry of Strongly Correlated Materials

H. Fujiwara; S. Naimen; A. Higashiya; Y. Kanai; H. Yomosa; K. Yamagami; T. Kiss; T. Kadono; S. Imada; A. Yamasaki; K. Takase; S. Otsuka; T. Shimizu; S. Shingubara; S. Suga; M. Yabashi; K. Tamasaku; T. Ishikawa; A. Sekiyama

arXiv · 1505.04591

Photoemission System with Polarized Hard X-rays for Probing Ground State Symmetry of Strongly Correlated Materials

H. Fujiwara·S. Naimen·A. Higashiya·Y. Kanai·H. Yomosa·K. Yamagami·T. Kiss·T. Kadono·S. Imada·A. Yamasaki·K. Takase·S. Otsuka·T. Shimizu·S. Shingubara·S. Suga·M. Yabashi·K. Tamasaku·T. Ishikawa·A. Sekiyama

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Abstract

We have developed a polarized hard X-ray photoemission (HAXPES) system to study the ground-state symmetry of strongly correlated materials. The linear polarization of the incoming X-ray beam is switched by the transmission-type phase retarder composed of two diamond (100) crystals. The best degree of the linear polarization $P_L$ is $-0.96$, containing the vertical polarization component of 98%. A newly developed low temperature two-axis manipulator enables easy polar and azimuthal rotations to select the detection direction of photoelectrons. The lowest temperature achieved is 9 K, offering us a chance to access the ground state even for the strongly correlated electron systems in cubic symmetry. The co-axial sample monitoring system with the long-working-distance microscope enables us to keep measuring the same region on the sample surface before and after rotation procedures. Combining this sample monitoring system with a micro-focused X-ray beam by means of an ellipsoidal Kirkpatrick-Baez mirror (25 $\mu$m $\times$ 25 $\mu$m (FWHM)), we have demonstrated the polarized valence-band HAXPES on NiO for voltage application as resistive random access memories to reveal the origin of the metallic spectral weight near the Fermi level.

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H. Fujiwara, S. Naimen, A. Higashiya, Y. Kanai, H. Yomosa, K. Yamagami, T. Kiss, T. Kadono, S. Imada, A. Yamasaki, K. Takase, S. Otsuka, T. Shimizu, S. Shingubara, S. Suga, M. Yabashi, K. Tamasaku, T. Ishikawa, A. Sekiyama. 2015-05-18. Photoemission System with Polarized Hard X-rays for Probing Ground State Symmetry of Strongly Correlated Materials. https://arxiv.org/abs/1505.04591

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