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arXiv · 1504.02869

Far field imaging of a dielectric inclusion

Abdul Wahab·Naveed Ahmed·Tasawar Abbas
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Abstract

A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.

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Abdul Wahab, Naveed Ahmed, Tasawar Abbas. 2015-04-11. Far field imaging of a dielectric inclusion. https://doi.org/10.1088/1742-6596%2F657%2F1%2F012001

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