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arXiv · 1504.02711

Tests of Sapphire Crystals Produced with Different Growth Processes for Ultra-stable Microwave Oscillators

Vincent Giordano·Christophe Fluhr·Serge Grop·Benoit Dubois
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Abstract

We present the characterization of 8-12 GHz whispering gallery mode resonators machined in high-quality sapphire crystals elaborated with different growth techniques. These microwave resonators are intended to constitute the reference frequency of ultra-stable Cryogenic Sapphire Oscillators. We conducted systematic tests near 4 K on these crystals to determine the unloaded Q-factor and the turnover temperature for whispering gallery modes in the 8-12 GHz frequency range. These characterizations show that high quality sapphire crystals elaborated with the Heat Exchange or the Kyropoulos growth technique are both suitable to meet a fractional frequency stability better than 1x10-15 for 1 s to 10.000 s integration times.

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Vincent Giordano, Christophe Fluhr, Serge Grop, Benoit Dubois. 2015-04-10. Tests of Sapphire Crystals Produced with Different Growth Processes for Ultra-stable Microwave Oscillators. https://doi.org/10.1109/tmtt.2015.2503748

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