arXiv · 1502.05115
Quantitative analysis of reptation of partially extended DNA in sub-30 nm nanoslits
Abstract
We observed reptation of single DNA molecules in fused silica nanoslits of sub-30 nm height. The reptation behavior and the effect of confinement are quantitatively characterized using orientation correlation and transverse fluctuation analysis. We show tube-like polymer motion arises for a tense polymer under strong quasi-2D confinement and interaction with surface- passivating polyvinylpyrrolidone (PVP) molecules in nanoslits, while etching- induced device surface roughness, chip bonding materials and DNA-intercalated dye-surface interaction, play minor roles. These findings have strong implications for the effect of surface modification in nanofluidic systems with potential applications for single molecule DNA analysis.
Explore related subjects
Keep this discovery
Jia-Wei Yeh, K. K. Sriram, Alessandro Taloni, Yeng-Long Chen, Chia-Fu Chou. 2015-02-18. Quantitative analysis of reptation of partially extended DNA in sub-30 nm nanoslits. https://arxiv.org/abs/1502.05115
Cite the original work for its findings. Save a collection to share your selection of sources.