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arXiv · 1410.2608

Environmental instability of few-layer black phosphorus

Joshua O. Island·Gary A. Steele·Herre S. J. van der Zant·Andres Castellanos-Gomez
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Abstract

We study the environmental instability of mechanically exfoliated few-layer black phosphorus (BP). From continuous measurements of flake topography over several days, we observe an increase of over 200% in volume due to the condensation of moisture from air. We find that long term exposure to ambient conditions results in a layer-by-layer etching process of BP flakes. Interestingly, flakes can be etched down to single layer (phosphorene) thicknesses. BP's strong affinity for water greatly modifies the performance of fabricated field-effect transistors (FETs) measured in ambient conditions. Upon exposure to air, we differentiate between two timescales for doping of BP FET transfer characterisitcs: a short timescale (minutes) in which a shift in the threshold voltage occurs due to physisorbed oxygen and nitrogen, and a long timescale (hours) in which p-type doping occurs from water absorption. Continuous measurements of BP FETs in air reveal eventual degradation and break-down of the channel material after several days due to the layer-by-layer etching process.

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Joshua O. Island, Gary A. Steele, Herre S. J. van der Zant, Andres Castellanos-Gomez. 2015-01-29. Environmental instability of few-layer black phosphorus. https://doi.org/10.1088/2053-1583%2F2%2F1%2F011002

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